Method of manufacturing a semiconductor device

ABSTRACT

Chipping of semiconductor chips is to be prevented. A semiconductor device comprises a semiconductor chip having a main surface, a plurality of pads formed over the main surface, a rearrangement wiring formed over the main surface to alter an arrangement of the plurality of pads, and a protective film and an insulating film formed over the main surface, and a plurality of solder bumps each connected to the rearrangement wiring and arranged differently from the plurality of pads. The presence of a bevel cut surface obliquely continuous to the main surface and formed on a periphery of the main surface of the semiconductor chip prevents chipping.

CROSS-REFERENCE TO RELATED APPLICATION

The present application claims priority from Japanese patent applicationNo. 2003-433603 filed on Dec. 26, 2003, the content of which is herebyincorporated by reference into this application.

BACKGROUND OF THE INVENTION

The present invention relates to a semiconductor device and itsmanufacturing method, and more particularly to a technique that can beeffectively applied to the prevention of chipping of semiconductorchips.

In a semiconductor device of a conventional chip size, a semiconductorchip has a configuration mainly consisting of a semiconductor substrateand, formed over the circuit formation surface which is the outer of theinner and outer surfaces of this semiconductor substrate, amulti-layered wiring layer formed by stacking a plurality each ofinsulating layers and wiring layers, and a surface protecting film soformed as to cover this multi-layered wiring layer (see Patent Reference1 for example).

-   -   Patent Reference 1: Japanese Unexamined Patent Publication No.        2000-294607 (FIG. 3)

SUMMARY OF THE INVENTION

Among recently developed small semiconductor devices including chipscale packages (CSPs), there are CSP type semiconductor devicesassembled by manufacturing techniques integrating the wafer process(pre-process) and the packaging process (post-process) (suchsemiconductor devices are known as wafer level CSP s or wafer processpackages).

A wafer level CSP undergoes a burn-in test in its screening procedure.For the test, the CSP is fitted to a socket dedicated for the purpose.First, the semiconductor chip is arranged with its main surface oppositethe concave portion of the socket in a state in which the inner surfaceof the semiconductor chip is suction-held by an arm. The arm isdescended in this state to cause the package to advance into the concaveportion of the socket, and the suction-holding of the package isdiscontinued before the package comes into contact with a terminal inthe concave portion of the socket, with the package being droppedslightly to be arranged in its due position.

In this process, when the end of the main surface of the semiconductorchip comes into contact with the inner wall of the concave portion, theend of the main surface is chipped. If any of the chipped silicon piecesremains in the concave portion of the socket, there will arise a problemthat the protective film over the surface of the semiconductor chip isdamaged when the back surface of the semiconductor chip is pressed bythe arm at the time of testing, eventually causing the protective filmto be peeled off.

Furthermore, if any silicon piece remains in the concave portion of thesocket, there will arise another problem that contact failure occursbetween the protruding electrodes of the package and the terminals ofthe socket, inviting a drop in test efficiency and accordingly in testreliability.

Still another problem that will arise is that the chipping invitesexposure of wiring inside the semiconductor chip, which would invitecorrosion or disconnection of the wiring and thereby make thesemiconductor chip fatally defective.

An object of the present invention is to provide a semiconductor devicewhich can prevent chipping, and its manufacturing method.

Another object of the invention is to provide a semiconductor devicewhich can contribute to enhance the efficiency of processing in thescreening procedure including the burn-in test and the reliability ofthe test, and its manufacturing method.

The above-described and other objects and novel features of the presentinvention will become apparent from the following description in thisspecification when taken in conjunction with the accompanying drawings.

Typical aspects of the invention disclosed in the present applicationwill be briefly described below.

According to the invention, there is provided a semiconductor devicehaving a main surface, a back surface opposite the main surface, andside surfaces; an integrated circuit formed over the main surface; aninsulating film covering the main surface; a plurality of electrodesexposed from the insulating film and arrayed over the main surface withfirst spacing; a plurality of wirings formed over the insulating film,one-end part of each of which is electrically connected to the pluralityof electrodes and the other-end part of each of which is arrayed withsecond spacing greater than the first spacing; and a plurality ofprotruding electrodes arranged over the other-end part of the pluralityof wirings, each being electrically connected to the other-end part tothe plurality of wirings, wherein an inclined surface continuous fromthe main surface to the side surfaces is formed on a periphery of themain surface of the semiconductor chip.

According to the invention, there is provided a semiconductor devicemanufacturing method comprising the steps of preparing a semiconductordevice provided with a main surface, a plurality of electrodes arrangedover the main surface, a rearrangement wiring, formed over the mainsurface, for rearranging each of the plurality of electrodes, asemiconductor chip having an inclined surface formed on a periphery ofthe main surface and obliquely continuous to the main surface, and aplurality of protruding electrodes each connected to the rearrangementwiring and arranged differently from the plurality of electrodes;arranging the semiconductor device in a concave portion of a socket in astate in which the main surface of the semiconductor chip is directedtoward a bottom surface of the concave portion; and subjecting thesemiconductor device to electrical inspection in a state in which thesemiconductor device is fitted in the concave portion of the socket.

According to the invention, there is also provided a semiconductordevice manufacturing method comprising the steps of preparing asemiconductor wafer having a main surface, a plurality of electrodesarranged over the main surface, a rearrangement wiring, formed over themain surface, for rearranging each of the plurality of electrodes, and aplurality of chip areas each connected to the rearrangement wiring, ineach of the areas a plurality of protruding electrodes arrangeddifferently from the plurality of electrodes being formed; forming aninclined surface obliquely continuing to the main surface on a peripheryof the main surface of each of the chip areas by first cutting thesemiconductor wafer with an angled blade along a dicing area whichpartitions the chip areas; and forming a plurality of semiconductordevices each having the inclined surface and the plurality of protrudingelectrodes by performing second cutting with a blade having a lessthickness than the angled blade along the dicing area to carry outdivision into individual pieces, each including the chip area.

According to the invention, there is further provided a semiconductordevice manufacturing method comprising the steps of preparing asemiconductor wafer having a main surface, a plurality of electrodesarranged over the main surface, a rearrangement wiring, formed over themain surface, for rearranging each of the plurality of electrodes, and aplurality of chip areas each connected to the rearrangement wiring, ineach of the areas a plurality of protruding electrodes arrangeddifferently from the plurality of electrodes being formed; forming aninclined surface obliquely continuing to the main surface on a peripheryof the main surface of each of the chip areas by first cutting thesemiconductor wafer with an angled blade along a dicing area whichpartitions the chip areas; forming a plurality of semiconductor deviceseach having the inclined surface and the plurality of protrudingelectrodes by performing second cutting with a blade having a lessthickness than the angled blade along the dicing area to carry outdivision into individual pieces, each including the chip area; arrangingthe semiconductor device in a concave portion of a socket in a state inwhich the main surface of the semiconductor chip constituting thesemiconductor device is directed toward a bottom surface of the concaveportion of the socket; and subjecting the semiconductor device toelectrical inspection in a state in which the semiconductor device isfitted in the concave portion of the socket.

According to the invention, there is also provided a semiconductordevice manufacturing method comprising the steps of preparing asemiconductor device having a main surface, a plurality of electrodesarranged over the main surface, a semiconductor chip formed on aperiphery of the main surface and having an inclined surface obliquelycontinuous to the main surface, and a plurality of protruding electrodesconnected to the electrodes; arranging the semiconductor device in aconcave portion of a socket in a state in which the main surface of thesemiconductor chip is directed toward a bottom surface of the concaveportion; and subjecting the semiconductor device to electricalinspection in a state in which the semiconductor device is fitted in theconcave portion of the socket.

According to the invention, there is further provided a semiconductordevice manufacturing method comprising the steps of preparing asemiconductor wafer having a main surface, a plurality of electrodesarranged over the main surface, and a plurality of chip areas in each ofwhich a plurality of protruding electrodes connected to each of theplurality of electrodes are formed; forming an inclined surfaceobliquely continuing to the main surface on a periphery of the mainsurface of each of the chip areas by first cutting the semiconductorwafer with an angled blade along a dicing area which partitions the chipareas; forming a plurality of semiconductor devices each having theinclined surface and the plurality of protruding electrodes byperforming second cutting with a blade having a less thickness than theangled blade along the dicing area to carry out division into individualpieces, each including the chip area; arranging the semiconductor devicein a concave portion of a socket in a state in which the main surface ofthe semiconductor chip constituting the semiconductor device is directedtoward the bottom surface of the concave portion of the socket; andsubjecting the semiconductor device to electrical inspection in a statein which the semiconductor device is fitted in the concave portion ofthe socket.

Advantages achieved by some of the most typical aspects of the inventiondisclosed in the present application will be briefly described below.

In a wafer level CSP or a bare chip, the formation of an inclinedsurface obliquely continuing to the main surface on the periphery of themain surface of the semiconductor chip by bevel cutting serves to easethe contact resistance which arises when the inclined surface comes intocontact with the concave portion of a socket at the time of itsinsertion into the socket during electrical inspection. In addition, theabsence of any edge part on the periphery of the main surface of thesemiconductor chip can serve to prevent chipping which would otherwiseoccur when the semiconductor chip is inserted into the socket. As thismakes it possible to prevent any silicon piece from remaining in theconcave portion of the socket, the reliability of electrical inspectionincluding the burn-in test and the functional test can be improved.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 consists of a partial plan showing one example of structure of asemiconductor device, which is Embodiment 1 of the invention, and anenlarged partial perspective view of a corner part thereof;

FIG. 2 is an enlarged partial perspective view of one example ofstructure of the semiconductor device shown in FIG. 1;

FIG. 3 is an enlarged partial section of the structure near an end ofthe semiconductor device shown in FIG. 1;

FIG. 4 is a process flowchart of one example of procedure in thepost-process of assembly of the semiconductor device shown in FIG. 1;

FIG. 5 is an enlarged partial plan of one example of structure of asemiconductor wafer cut at the dicing step of assembly charted in FIG.4;

FIG. 6 is an enlarged partial section of the structure of thesemiconductor wafer shown in FIG. 5;

FIG. 7 is an enlarged partial section of one example of structure of thesemiconductor wafer before bevel cutting at the dicing step charted inFIG. 4;

FIG. 8 is an enlarged partial section of one example of state of beingcut in a first stage of bevel cutting at the dicing step charted in FIG.4;

FIG. 9 is an enlarged partial section of one example of state of beingcut in a second stage of cutting after the first stage shown in FIG. 8;

FIG. 10 is an enlarged partial section of one example of structure afterthe completion of the second stage of cutting shown in FIG. 9;

FIG. 11 is a sectional view showing one example of method of fitting thesemiconductor device to a socket at the burn-in step of assembly chartedin FIG. 4;

FIG. 12 is a sectional view showing one example of structure after thesocket is fitted by the fitting method shown in FIG. 11;

FIG. 13 is a sectional view showing one example of state of contactbetween the protruding electrodes of the semiconductor device and socketterminals when under burn-in test at the burn-in step of assemblycharted in FIG. 4;

FIG. 14 is a sectional view showing one example of state before thefitting of the socket when the semiconductor device is to be fitted tothe socket at the testing step of assembly charted in FIG. 4;

FIG. 15 is a sectional view showing one example of state in which thesemiconductor device is fitted to the socket at the testing step ofassembly charted in FIG. 4;

FIG. 16 is a sectional view showing one example of structure after thecompletion of the fitting of the semiconductor device to the socket atthe testing step of assembly charted in FIG. 4;

FIG. 17 is a sectional view showing one example of state of contactbetween the protruding electrodes of the semiconductor device and socketterminals under functional testing at the testing step charted in FIG.4;

FIG. 18 is a partial section of one example of packaging structure inwhich the semiconductor device shown in FIG. 1 is mounted over a mountboard;

FIG. 19 is an enlarged partial section of the structure of asemiconductor device, which is a comparative example to thesemiconductor device shown in FIG. 1; and

FIG. 20 is a section of one example of structure of a semiconductordevice, which is Embodiment 2 of the present invention.

DESCRIPTION OF THE PREFERRED EMBODIMENTS OF THE INVENTION

In the following description of the preferred embodiments of theinvention, description of the same or similar parts will not be repeatedin principle unless repetition is necessary.

In the following description of the embodiments, though any singleembodiment may be referred to as a plurality of sections or embodimentsinto which it is divided where the convenience of description requiressuch division, the divided sections or embodiments are not unrelated toone another unless expressly stated otherwise, but each is amodification, details or supplementary explanation of any part or thewhole of others.

In the following description of the embodiments, where the number(value, quantity, range or the like) of any element is referred to, itsnumber or the like is not confined to that stated number or the like butany other number of the greater or smaller than that stated one may beacceptable unless confinement is expressly stated or evident from theunderlying principle.

Preferred embodiments of the present invention will be described indetail below with reference to drawings. In all the drawingsillustrating the embodiments, members having the same function will bedenoted by respectively the same reference signs, and their descriptionwill not be repeated.

Embodiment 1

FIG. 1 consists of a partial plan showing one example of structure of asemiconductor device, which is Embodiment 1 of the invention, and anenlarged partial perspective view of a corner part thereof; FIG. 2 is anenlarged partial perspective view of one example of structure of thesemiconductor device shown in FIG. 1; FIG. 3 is an enlarged partialsection of the structure near an end of the semiconductor device shownin FIG. 1; FIG. 4 is a process flowchart of one example of procedure inthe post-process of assembly of the semiconductor device shown in FIG.1; FIG. 5 is an enlarged partial plan of one example of structure of asemiconductor wafer cut at the dicing step of assembly charted in FIG.4; FIG. 6 is an enlarged partial section of the structure of thesemiconductor wafer shown in FIG. 5; FIG. 7 is an enlarged partialsection of one example of structure of the semiconductor wafer beforebevel cutting at the dicing step charted in FIG. 4; FIG. 8 is anenlarged partial section of one example of state of being cut in a firststage of bevel cutting at the dicing step charted in FIG. 4; FIG. 9 isan enlarged partial section of one example of state of being cut in asecond stage of cutting after the first stage shown in FIG. 8; FIG. 10is an enlarged partial section of one example of structure after thecompletion of the second stage of cutting shown in FIG. 9; FIG. 11 is asectional view showing one example of method of fitting thesemiconductor device to a socket at the burn-in step of assembly chartedin FIG. 4; FIG. 12 is a sectional view showing one example of structureafter the socket is fitted by the fitting method shown in FIG. 11; FIG.13 is a sectional view showing one example of state of contact betweenthe protruding electrodes of the semiconductor device and socketterminals when under burn-in test at the burn-in step of assemblycharted in FIG. 4; FIG. 14 is a sectional view showing one example ofstate before the fitting of the socket when the semiconductor device isto be fitted to the socket at the testing step of assembly charted inFIG. 4; FIG. 15 is a sectional view showing one example of state inwhich the semiconductor device is fitted to the socket at the testingstep; FIG. 16 is a sectional view showing one example of structure afterthe completion of the fitting of the semiconductor device to the socketat the testing step; FIG. 17 is a sectional view showing one example ofstate of contact between the protruding electrodes of the semiconductordevice and socket terminals under functional testing at the testingstep; FIG. 18 is a partial section of one example of packaging structurein which the semiconductor device shown in FIG. 1 is mounted over amount board; FIG. 19 is an enlarged partial section of the structure ofa semiconductor device, which is a comparative example to thesemiconductor device shown in FIG. 1; and FIG. 20 is a section of oneexample of structure of a semiconductor device, which is Embodiment 2 ofthe invention.

The semiconductor device of this Embodiment 1 is a wafer level CSP (alsocalled “wafer process package”) 5 assembled by a manufacturing techniqueintegrating a wafer process (the pre-process) and a package process (thepost-process).

To describe the configuration of the wafer level CSP 5 with reference toFIG. 1 through FIG. 3, it comprises a semiconductor chip 2 having a mainsurface 2 b, an integrated circuit formed over the main surface 2 b,pads 2 a which are a plurality of electrodes arranged over the mainsurface 2 b, rearrangement wiring 2 e formed over the main surface 2 bto alter the arrangement of the plurality of pads 2 a and an insulatingfilm formed over the main surface 2 b, and solder bumps 3 which are aplurality of protruding electrodes each connected to the rearrangementwiring 2 e and arranged differently from the plurality of pads 2 a,wherein a bevel cut surface 2 m, which is an inclined surface obliquelycontinuous to the main surface 2 b, is formed on the periphery of themain surface 2 b of the semiconductor chip 2. A spacing A (firstspacing) between adjoining pads 2 a is 60 μm for instance, and a spacingB (second spacing) between the solder bumps 3 is widened by therearrangement wiring 2 e to 200 μm for instance.

Thus, the semiconductor chip 2 has the bevel cut surface 2 m, which is asurface obliquely cut on the periphery of the main surface 2 b as shownin the enlarged view of FIG. 1. The bevel cut surface 2 m is formed,when the wafer is diced into individual semiconductor chips 2, bychamfering the edge all around by using an angled blade 9 shown in FIG.7.

This bevel cut surface 2 m is intended to prevent, when the wafer levelCSP 5 is inserted into a socket in an electrical inspection after theassembly of the wafer level CSP or on a similar occasion, the edge ofthe main surface 2 b of the semiconductor chip 2 from being chipped byits coming into contact with the socket. On that occasion, chipping ismore likely to occur in a direction at an angle of 45° to the mainsurface 2 b. This is because the crystal orientation of silicon is at anangle of 45° to the main surface 2 b, and it is therefore preferable toso form the bevel cut surface 2 m as to avoid making the angle formed bythe main surface 2 b and the bevel cut surface 2 m 45°. Also with a viewto sufficiently ease the contact resistance which occurs between thesemiconductor chip 2 and the socket when the former is inserted into thelatter, it is preferable to so form the bevel cut surface 2 m as to makethe angle formed by the main surface 2 b and the bevel cut surface 2 mgreater than 45°.

In a wafer level CSP, unlike a semiconductor device formed by packaginga chip with sealing resin or the like, the sides 2 d and the backsurface 2 c of the semiconductor chip 2 are exposed, and accordinglyboth the sides 2 d and the back surface 2 c are susceptible to damagedue to chipping by silicon pieces. Thus, by making the wafer level CSP 5immune from chipping, a similar effect can be achieved for the sides 2 dand the back surface 2 c, too.

Further, in the wafer level CSP 5, the solder bumps (protrudingelectrodes) 3, which are a plurality of external terminals are arrayedover the main surface 2 b of the semiconductor chip 2 as shown in FIG.1, similarly to a ball grid array (BGA) in appearance.

Further, in the wafer level CSP 5, the rearrangement wiring 2 e isfurther connected to the pads 2 a, which are electrodes formed over themain surface 2 b of the semiconductor chip 2 as shown in FIG. 2, and thesolder bumps 3 are connected to this rearrangement wiring 2 e via an Aulayer 2 s. This rearrangement wiring 2 e is intended for the relayingpurpose to replace the arrangement of the pads 2 a, consisting ofaluminum or the like, with an arrangement which permits mounting of thesolder bumps 3. Thus in the wafer level CSP 5, as the arrangement pitchof the pads 2 a is narrowed and therefore the solder bumps 3, which areexternal terminals, cannot be mounted directly on the pads 2 a, thepitch is widened with the rearrangement wiring 2 e to enable the solderbumps 3 to be mounted, and the solder bumps 3 are connected to therearrangement wiring 2 e.

This enables the plurality of solder bumps 3 to be arranged in an arrayform.

Incidentally, the rearrangement wiring 2 e has a three-layered structurecomprising an Ni layer 2 p, a Cu layer 2 q and a Cr layer 2 r forinstance. The Ni layer 2 p, the Cu layer 2 q and the Cr layer 2 r arearranged in this order inward from the surface side, and the Cr layer 2r are connected to the pads 2 a. The Ni layer 2 p is connected to thesolder bumps 3 via the Au layer 2 s for better connection to the solderbumps 3.

Further, above a silicon substrate 2 k, there are formed metal wiringlayers, each via an insulating layer 2 f, which is an inter-layerinsulating film as shown in FIG. 3. For instance, over the siliconsubstrate 2 k, there are formed a first layer metal wiring M1, a secondlayer metal wiring M2 and a third layer metal wiring M3, each via aninsulating layer 2 f. The first layer metal wiring M1 and the secondlayer metal wiring M2 are connected to each other, and so are the secondlayer metal wiring M2 and the third layer metal wiring M3, both via aplug 2 j. To add, the third layer metal wiring M3 shown in FIG. 3corresponds to the wiring layer of the pads 2 a in FIG. 2.

Further, as shown in FIG. 2, the pads 2 a formed over the main surface 2b are covered by a protective film 2 g, which is a passivation film,except in the part it is connected to the rearrangement wiring 2 e. Overthe protective film 2 g, a first insulating film 2 h is formed in alaminated way, and over this first insulating film 2 h is stacked therearrangement wiring 2 e. Further over the rearrangement wiring 2 e, asecond insulating film 2 i is laminated in a state of being deprived ofits connecting parts to the solder bumps 3.

Incidentally, the protective film 2 g consists of SiN, for instance, andthe first insulating film 2 h and the second insulating film 2 i consistof polyimide or the like, for example.

In the protective film 2 g over the main surface 2 b of thesemiconductor chip 2, an anti-chipping groove 2 n is cut in a positionat a prescribed distance (e.g. about tens of μm) from the end of thefilm as shown in FIG. 3. The presence of this groove 2 n can prevent thechipping, if any, from proceeding any farther than the groove 2 n.

Now, the bevel cut surface 2 m of the semiconductor chip 2 in the waferlevel CSP 5 is formed in a state of obliquely crossing partly or wholly,in the thickness direction, of insulating layers (inter-layer insulatingfilms) 2 f formed over the top and bottom surfaces of a plurality ofwiring layers (the first layer metal wiring M1, the second layer metalwiring M2 and the third layer metal wiring M3 here).

Further, the bevel cut surface 2 m is formed outside the wiring arrangedoutermost of the plurality of wiring layers (e.g. the first layer metalwiring M1, the second layer metal wiring M2 and the third layer metalwiring M3). In other words, the bevel cut surface 2 m is formed in theoutermost position among the plurality of metal wirings formed over thesilicon substrate 2 k, where wiring is not cut.

In the wafer level CSP 5 of this Embodiment 1, the formation of thebevel cut surface 2 m obliquely continuing to the main surface 2 b bybevel cutting (chamfering) on the peripheral part of the main surface 2b of the semiconductor chip 2 can serve to ease the contact resistancewhich occurs on the semiconductor chip 2 from the coming into contact ofthe bevel cut surface 2 m with the socket when the wafer level CSP 5 isinserted into the socket for burn-in testing in the post-process. Inaddition, the absence of an edge part 15 a (see FIG. 19) on theperiphery of the main surface 2 b of the semiconductor chip 2 can serveto prevent chipping which would otherwise occur when the wafer level CSP5 is inserted into the socket.

Moreover, since chipping can be prevented on the periphery of the mainsurface 2 b of the semiconductor chip 2, the protective film 2 g overthe surface of the semiconductor chip 2 can be prevented from comingoff, and the internal metal wiring can be thereby prevented frombecoming exposed. Therefore, the semiconductor chip 2 can be preventedfrom running into a fatal failure due to corrosion or disconnection ofthe wiring. This makes it possible to enhance the quality andreliability of the wafer level CSP 5 and at the same time to raise theyield of the assembly of the wafer level CSP 5.

Next will be described a manufacturing method of the wafer level CSP 5(semiconductor device), which is Embodiment 1, with referenced to theprocess chart of FIG. 4.

First, dicing is performed at the dicing step referred to as step S1.

At this step, as shown in FIG. 5 and FIG. 6, a semiconductor wafer 1 isfabricated, which comprises a main surface 1 a, a plurality of pads 2 aarranged over the main surface 1 a as shown in FIG. 2, rearrangementwiring 2 e formed in the upper layer of the main surface 1 a andrearranges each of the plurality of pads 2 a, and a plurality of chipareas 1 d in each of which a plurality of solder bumps 3 each connectedto the rearrangement wiring 2 e and disposed in a different arrangementfrom the plurality of pads 2 a are formed.

Incidentally, over the main surface 1 a of the semiconductor wafer 1, adicing area 1 b which partitions each of the chip areas 1 d is formed,and in the dicing area 1 b a plurality of test patterns (testingconductors) 1 c are further formed.

After that, as shown in FIG. 7, the semiconductor wafer 1 is subjectedto first cutting with the angled blade 9 along the dicing area 1 b, andthe bevel cut surface 2 m obliquely continuing to the main surface 1 ais formed on the periphery of the main surface 1 a each of the chipareas 1 d. Incidentally, this first cutting is half cutting to themiddle of the thickness of the semiconductor wafer 1 as shown in FIG. 8.

At this cutting step, the semiconductor wafer 1 is half cut with theangled blade 9 having a tapered surface 9 a of a prescribed angle sothat the angle formed by the main surface 2 b of the semiconductor chip2 and the bevel cut surface 2 m after the cutting be greater than 45°.

Further the first cutting described above is accomplished with theangled blade 9 as shown in FIG. 8 not to let the test patterns 1 c shownin FIG. 7, formed in the dicing area 1 b of the main surface 1 a of thesemiconductor wafer 1 remain. If the test patterns 1 c remained,chipping would arise from there.

After the first cutting, second cutting is performed with a blade 10shown in FIG. 9, which is less thick than the angled blade 9, along thedicing area 1 b similarly to the first cutting. This second cutting isfull cutting. This cutting method comprising the first cutting and thesecond cutting is referred to as bevel cutting.

By performing the bevel cutting, the semiconductor chip 2 is dividedinto individual pieces, each consisting of a chip area 1 d, and aplurality of wafer level CSPs 5 shown in FIG. 10, each having a bevelcut surface 2 m and a plurality of solder bumps 3, are formed.

To add, the bevel cut surface 2 m is formed in a state of obliquelycrossing part or the whole, in the thickness direction, of theinsulating layers 2 f, which are inter-layer insulating films formed onboth surfaces of each of the plurality of metal wiring layers within thesemiconductor chip 2. It is formed in a position farther outside thewiring arranged as the outermost wiring among the plurality of metalwiring layers and obliquely relative to the main surface 2 b.

After the completion of the dicing step, a desired mark is attached tothe wafer level CSP 5 at the marking step referred to as step S2 in FIG.4.

After the completion of the marking step, the process will advance tothe burn-in step referred to as step S3, at which the wafer level CSP 5is subjected to a burn-in test, which is electrical inspection.

At the burn-in step, first the wafer level CSP 5 is arranged in aconcave portion 4 a in a state wherein the main surface 2 b of thesemiconductor chip 2 of the wafer level CSP 5 is directed toward thebottom surface 4 b of the concave portion 4 a of a burn-in socket 4fitted to a burn-in port 12 as shown in FIG. 11. Thus, the wafer levelCSP 5 held by a fitting block 11 by suction is arranged over the burn-insocket 4, and the fitting block 11 is brought down toward the burn-insocket 4 to cause the wafer level CSP 5 to enter into the concaveportion 4 a of the burn-in socket 4. After its entrance, the holding ofthe wafer level CSP 5 by suction is stopped just before the wafer levelCSP 5 comes into contact with a contact sheet 4 c of the concave portion4 a, and the wafer level CSP 5 is thereby dropped slightly to bearranged in the concave portion 4 a.

In this process, since the wafer level CSP 5 of this Embodiment 1 hasthe slanted bevel cut surface 2 m formed by bevel cutting on theperiphery of the main surface 2 b of the semiconductor chip 2, when itis inserted into the burn-in socket 4, even if the chip end comes intocontact with the inner wall 4 d of the concave portion 4 a of theburn-in socket 4, the contact resistance working on the semiconductorchip 2 can be eased. Occurrence of chipping can be thereby prevented.

Further, since no edge part 15 a like what is formed on thesemiconductor chip 15 of the wafer level CSP 14 of the comparativeexample shown in FIG. 19 is formed on the periphery of the main surface2 b of the semiconductor chip 2, prevention of chipping at the time ofinsertion into the burn-in socket 4 can be further ensured.

After that, the wafer level CSP 5 is subjected to a burn-in test in astate in which the wafer level CSP 5 is fitted in the concave portion 4a with the lid 4 e of the burn-in socket 4 closed as shown in FIG. 12.The burn-in test is performed in a state in which the back surface 2 cof the semiconductor chip 2 is pressed against the bottom surface 4 b ofthe concave portion 4 a of the burn-in socket 4 by a pressing portion 4f disposed within the lid 4 e.

The burn-in test is carried out under conditions of, for instance,125±5° C. in temperature, duration of 32 hours, Vdd=4.6±0.2 V andVpp=7.0±0.2 V. The test conditions, however, are not limited to these.

Since the wafer level CSP 5 of this Embodiment 1 can be prevented fromchipping, it is possible to prevent silicon pieces from dropping intoand remaining in the concave portion 4 a of the burn-in socket 4. As aresult, as shown in FIG. 13, when the burn-in test is to be performed bybringing the solder bumps 3 of the wafer level CSP 5 into contact withthe contact sheet 4 c, which is a terminal of the burn-in socket 4,contact failure can be prevented from occurring between the solder bumps3 and the contact sheet 4 c, and the reliability of the burn-in test canbe therefore enhanced.

Moreover, since contact failure can be prevented as stated above, theefficiency of processing in the screening procedure including theburn-in test can be enhanced.

Further, as no silicon piece remains in the concave portion 4 a of theburn-in socket 4, when the semiconductor chip 2 is pressed from the backsurface 2 c side during the test, the protective film 2 g on the surfaceof the semiconductor chip 2 can be prevented from being damaged by anysilicon piece.

After the completion of the burn-in test, the process will advance tothe baking step referred to as step S4 in FIG. 4 to perform baking. Thebaking in this context means heat treatment on a gate insulating filminside the semiconductor chip 2 for instance. It is performed by takingthe wafer level CSP 5 out of the burn-in socket 4 and accommodating iton a tray. It has to be noted, however, that not every product need besubjected to this baking.

After the completion of the baking, the process will advance to thetesting step referred to as step S5 to undergo functional testing. Thus,the wafer level CSP 5 is subjected to a functional test.

First, as shown in FIG. 14, the wafer level CSP 5 held by the fittingblock 11 by suction is arranged over a test socket (another socket) 6.Then, as shown in FIG. 15, the fitting block 11 is descended toward thetest socket 6 to arrange the wafer level CSP 5, in a sucked state, overthe concave portion 6 a in the pedestal 6 e of the test socket 6.

After that, as shown in FIG. 16, the pedestal 6 e is fixed to the testsocket 6 by locking, and the functional test is carried out in thisstate. During the test, as shown in FIG. 17, the solder bumps 3 of thewafer level CSP 5 are brought to contact with contact pins 6 c, whichare terminals disposed on the bottom surface 6 b of the test socket 6 torespectively match the solder bumps 3.

Since the wafer level CSP 5 of this Embodiment 1 has the slanted bevelcut surface 2 m formed by bevel cutting on the periphery of the mainsurface 2 b of the semiconductor chip 2, when it is inserted into thetest socket 6, as in the burn-in test, even if the chip end comes intocontact with the inner wall 6 d of the concave portion 6 a in thepedestal 6 e of the test socket 6, the contact resistance working on thesemiconductor chip 2 can be eased. Occurrence of chipping can be therebyprevented.

Further, since chipping can be prevented from occurring, it is possibleto prevent silicon pieces from dropping into and remaining in theconcave portion 6 a in the pedestal 6 e of the test socket 6 or onto andon the contact pins 6 c. As a result, as shown in FIG. 17, when thefunctional test is to be performed by bringing the solder bumps 3 of thewafer level CSP 5 into contact with the contact pins 6 c of the testsocket 6, contact failure can be prevented from occurring between thesolder bumps 3 and the contact pins 6 c, and the reliability of thefunctional test can be therefore enhanced.

Moreover, since contact failure can be prevented as stated above, theefficiency of processing in the screening procedure including thefunctional test can be enhanced.

Further, as no silicon piece remains the pedestal 6 e or on the contactpins 6 c, when the semiconductor chip 2 is pressed from the back surface2 c side, the protective film 2 g on the surface of the semiconductorchip 2 can be prevented from being damaged by any silicon piece. In thisprocess, even if a semiconductor chip 2 having no bevel cut surface 2 mdoes not suffer chipping when it is inserted into the test socket 6, itmay still suffer chipping because the back surface 2 c of thesemiconductor chip 2 is pressed at the testing step. Unlike such a case,as this Embodiment 1 has the bevel cut surface 2 m, chipping due to thepressing of the back surface 2 c of the semiconductor chip 2 can also beprevented.

The steps from S3 until S5 described above may be collectively referredto as the screening procedure.

After the completion of the functional test, the process will advance tothe exterior inspection referred to as step S6 in FIG. 4. The exteriorinspection is carried out in a state wherein the wafer level CSP 5 istaken out of the test socket 6 and accommodated on a tray. Thiscompletes the assembly of the wafer level CSP 5.

To add, as shown in FIG. 18, when the wafer level CSP 5 is to bepackaged over amount board 7, for instance it is mounted by solderreflowing, and lands 7 a of the mount board 7 and the solder bumps 3 areconnected by soldering. Furthermore, under-fill sealing is accomplishedwith sealing resin 8.

As a variation of the manufacturing method of the semiconductor deviceof this Embodiment 1, a wafer level CSP (semiconductor device) 5provided with a semiconductor chip 2 on which a bevel cut surface 2 m isformed by bevel cutting can be made ready in advance, and this waferlevel CSP 5 can be fitted to a burn-in socket 4 to be subjected to aburn-in test, possibly followed by its fitting to a test socket 6 forfunctional testing. In either case, chipping can be prevented, and thereliability of testing, including electrical inspection using a socket,can be enhanced. In addition, since contact failure can be preventedfrom occurring between the solder bumps 3 of the wafer level CSP 5 andterminals of the socket, the processing efficiency of the screeningprocedure including the burn-in test and the functional test can beimproved.

Embodiment 2

FIG. 20 is a section of one example of structure of a semiconductordevice, which is Embodiment 2 of the present invention.

The semiconductor device of this Embodiment 2 shown in FIG. 20 comprisesa bare chip 13 having a semiconductor element over its main surface 13 aand solder bumps 3, which are a plurality of protruding electrodesdisposed over that main surface 13 a. An insulating film 13 c is formedover a silicon substrate 13 b, pads 13 e, which are a plurality ofelectrodes, are formed over the main surface 13 a of this insulatingfilm 13 c, and the solder bumps 3 are connected to the pads 13 e via abarrier metal layer 13 f.

Incidentally, in the bare chip 13, metal wiring is formed within thelayer of the insulating film 13 c, and a bevel cut surface 13 g isformed to obliquely cross part or the whole, in the thickness direction,of this layer of the insulating film 13 c.

Thus, when dicing the semiconductor wafer 1 (see FIG. 5) to form thebare chip 13, by using the method of bevel cutting described withreference to Embodiment 1, the bevel cut surface 13 g can be formed onthe bare chip 13.

Incidentally, a protective film 13 d consisting of SiN is formed in thelayer above the insulating film 13 c, namely over the main surface 13 aof the bare chip 13, and the circumference of each of the pads 13 e isalso cover with the protective film 13 d except where it is connected toa solder bump 3.

The insulating film 13 c consists of SiO2 for instance, the pads 13 e,of aluminum for instance, and the solder bumps 3, of a Pb—Sn alloy forinstance.

In this semiconductor device having the bare chip 13 and the solderbumps 3, too, the presence of the bevel cut surface 13 g serves toprevent chipping, as is the case with the wafer level CSP 5 ofEmbodiment 1.

Furthermore, since chipping can be prevented, the reliability oftesting, including electrical inspection, in which this bare chip 13 isfitted to a socket or the like, can be enhanced. The testing conditionsare similar to those described with reference to Embodiment 1.

In addition, since contact failure can be prevented from occurringbetween the solder bumps 3 of the semiconductor device having a barechip 13 and the terminals of the socket, the processing efficiency ofthe screening procedure including the burn-in test and the functionaltest can be improved.

While the invention accomplished by the present inventors has beendescribed so far in specific terms with reference to preferredembodiments thereof, obviously the invention is not confined to theseembodiments, but can be modified in various ways without deviating fromits true spirit and scope.

For instance, although the foregoing description of Embodiment 1referred to a case in which three metal wiring layers are formed in theinsulating layer 2 f having inter-layer insulating films, the number oflayers of the metal wiring may be any other number than three.

The present invention is particularly effective for products in whichthe semiconductor chip is exposed, such as wafer level CSPs. In packagedproducts such as ball grid arrays (BGAs), in which the semiconductorchip is sealed with resin, this problem of chipping is unlikely tooccur.

The present invention can be suitably applied to electronic devices andsemiconductor manufacturing technology.

1-5. (canceled)
 6. A manufacturing method of a semiconductor devicecomprising the steps of: (a) preparing a semiconductor device providedwith a main surface, a plurality of electrodes arranged over said mainsurface, a rearrangement wiring, formed over said main surface, forrearranging each of said plurality of electrodes, a semiconductor chiphaving an inclined surface formed on a periphery of said main surfaceand obliquely continuous to said main surface, and a plurality ofprotruding electrodes each connected to said rearrangement wiring andarranged differently from said plurality of electrodes, (b) arrangingsaid semiconductor device in a concave portion of a socket in a state inwhich said main surface of said semiconductor chip is directed toward abottom surface of said concave portion, and (c) subjecting saidsemiconductor device to electrical inspection in a state in which saidsemiconductor device is fitted in said concave portion of said socket.7. The manufacturing method of a semiconductor device according to claim6, wherein a burn-in test is performed at said step (c) as saidelectrical inspection.
 8. A manufacturing method of a semiconductordevice comprising the steps of: (a) preparing a semiconductor waferhaving a main surface, a plurality of electrodes arranged over said mainsurface, a rearrangement wiring, formed over said main surface, forrearranging each of said plurality of electrodes, and a plurality ofchip areas each connected to said rearrangement wiring, in each of saidareas a plurality of protruding electrodes arranged differently fromsaid plurality of electrodes being formed, (b) forming an inclinedsurface obliquely continuing to said main surface on a periphery of saidmain surface of each of said chip areas by first cutting saidsemiconductor wafer with an angled blade along a dicing area whichpartitions said chip areas, and (c) forming a plurality of semiconductordevices each having said inclined surface and said plurality ofprotruding electrodes by performing second cutting with a blade having aless thickness than said angled blade along said dicing area to carryout division into individual pieces, each including said chip area.
 9. Amanufacturing method of a semiconductor device comprising the steps of:(a) preparing a semiconductor wafer having a main surface, a pluralityof electrodes arranged over said main surface, a rearrangement wiring,formed over said main surface, for rearranging each of said plurality ofelectrodes, and a plurality of chip areas each connected to saidrearrangement wiring, in each of said areas a plurality of protrudingelectrodes arranged differently from said plurality of electrodes beingformed, (b) forming an inclined surface obliquely continuing to saidmain surface on a periphery of said main surface of each of said chipareas by first cutting said semiconductor wafer with an angled bladealong a dicing area which partitions said chip areas, (c) forming aplurality of semiconductor devices each having said inclined surface andsaid plurality of protruding electrodes by performing second cuttingwith a blade having a less thickness than said angled blade along saiddicing area to carry out division into individual pieces, each includingsaid chip area, (d) arranging said semiconductor device in a concaveportion of a socket in a state in which said main surface of saidsemiconductor chip constituting said semiconductor device is directedtoward a bottom surface of said concave portion of said socket, and (e)subjecting said semiconductor device to electrical inspection in a statein which said semiconductor device is fitted in said concave portion ofsaid socket.
 10. The manufacturing method of a semiconductor deviceaccording to claim 9, wherein said first cutting is performed at saidstep (b) so that testing conductors formed over the main surface of saidsemiconductor wafer do not remain.
 11. The manufacturing method of asemiconductor device according to claim 9, wherein said first cutting isperformed to form said inclined surface at said step (b) so that anangle formed by said main surface of said semiconductor chip and saidinclined surface is greater than 45°.
 12. The manufacturing method of asemiconductor device according to claim 9, wherein a burn-in test isperformed at said step (e) as said electrical inspection.
 13. Themanufacturing method of a semiconductor device according to claim 12,wherein said burn-in test is performed at said step (e) in a state inwhich said back surface of the semiconductor chip is pressed against abottom surface of said concave portion of said socket.
 14. Themanufacturing method of a semiconductor device according to claim 9,wherein said semiconductor device is arranged in a concave portion ofanother socket and subjected to a functional test in a state in whichsaid semiconductor device is fitted in said other socket after said step(e).
 15. The manufacturing method of a semiconductor device according toclaim 9, wherein said semiconductor device is packaged over a mountboard after said step (e).
 16. A manufacturing method of a semiconductordevice comprising the steps of: (a) preparing a semiconductor devicehaving a main surface, a plurality of electrodes arranged over said mainsurface, a semiconductor chip formed on a periphery of said main surfaceand having an inclined surface obliquely continuous to said mainsurface, and a plurality of protruding electrodes connected to saidelectrodes, (b) arranging said semiconductor device in a concave portionof a socket in a state in which said main surface of said semiconductorchip is directed toward a bottom surface of said concave portion, and(c) subjecting said semiconductor device to electrical inspection in astate in which said semiconductor device is fitted in said concaveportion of said socket.
 17. A manufacturing method of a semiconductordevice comprising the steps of: (a) preparing a semiconductor waferhaving a main surface, a plurality of electrodes arranged over said mainsurface, and a plurality of chip areas in each of which a plurality ofprotruding electrodes connected to each of said plurality of electrodesare formed, (b) forming an inclined surface obliquely continuing to saidmain surface on a periphery of said main surface of each of said chipareas by first cutting said semiconductor wafer with an angled bladealong a dicing area which partitions said chip areas, (c) forming aplurality of semiconductor devices each having said inclined surface andsaid plurality of protruding electrodes by performing second cuttingwith a blade having a less thickness than said angled blade along saiddicing area to carry out division into individual pieces, each includingsaid chip area, (d) arranging said semiconductor device in a concaveportion of a socket in a state in which said main surface of saidsemiconductor chip constituting said semiconductor device is directedtoward a bottom surface of said concave portion of said socket, and (e)subjecting said semiconductor device to electrical inspection in a statein which said semiconductor device is fitted in said concave portion ofsaid socket.
 18. The manufacturing method of a semiconductor deviceaccording to claim 17, wherein said first cutting is performed at saidstep (b) so that testing conductors formed over the main surface of saidsemiconductor wafer do not remain.
 19. The manufacturing method of asemiconductor device according to claim 17, wherein said first cuttingis performed to form said inclined surface at said step (b) so that anangle formed by said main surface of said semiconductor chip and saidinclined surface is greater than 45°.
 20. The manufacturing method of asemiconductor device according to claim 17, wherein a burn-in test isperformed at said step (e) as said electrical inspection.